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Main Office |
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926-27 KT bldg, 3rd fl. Ipsuk
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-dong Daegu, 701-050, Korea
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Tel : +82-53-984-7063
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Fax : +82-53-984-7065
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Branch Office in Gyeonggi |
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605 Donggin Apt. 1511-10,
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Gwanyang-dong Anyang-si,
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Gyeonggi-do, Korea
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Tel : +82-31-424-7063
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Fax : +82-31-422-7065
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Home Page
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http://www.elecscom.com
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Contact Point
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Jongsik Park
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Tel : +82-10-3813-4375
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e-mail : jspark@elecscom.com
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Taiyi Kim
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Tel : +82-10-2877-4796
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e-mail : tykim@elecscom.com
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Semiconductor Parametric Test
System (EL 1400) |
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E1400 test system is designed to perform fast and precise DC measurements,
capacita-
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ance measurements,
flash memory cell test, and other semiconductor applications.
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E1400 test system supports real four parallel tests. The system is consist of four sub-
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frames. Each sub-frame supports real parallel test.
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The system supports up to 32 SMUs. (Each sub-frame : up to 8 SMUs)
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The system supports a fully guarded switching matrix customizable from 48 to 106 pins.
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(Each sub-frame : from 12 to 26 pins)
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DC Measurement
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Hardware : SMU
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Measurement Range : 10fA to 100mA
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Force
Range : ±100V, ±100mA
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Switching Matrix
Measurement Pins
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Total : 106 Pin
(sub-frame x 4)
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Hardware : 4284A (Agilent)
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Pulse Force
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Hardware : 81110A (Agilent)
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