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TITLE
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Semiconductor
Device Measurement and Analysis using
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Semiconductor
Test and Analyzer
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Autors
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Jong-Sik
Park, Han-Jung Song, Yong-Soo Park
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Publisher
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Daeyoung Sa, 2002
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Contents
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Part
1. Measurement of semiconductor Devices
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1.
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I-V characteristic of resistor
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2.
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I-V characteristic of diode
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3.
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I-V characteristic of zener-diode
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4.
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Characteristics of BJT
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5.
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Characteristics of JFET
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6.
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Characteristics of MOSFET
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7.
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Characteristics of OP-AMP
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Part
2. SPICE parameter extraction of BJT and
MOSFET
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8.
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Extraction of Gummel-Poon Equivalent Circuit Parameters
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for
BJT using PSPICE
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9.
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Extraction
of Gummel-Poon Equivalent Circuit Parameters
for BJT using STA
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10
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Extraction
of Level 1 SPICE Equivalent Circuit Parameters
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for
MOS Transistor using SPICE
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11.
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Extraction
of Level 1 SPICE Equivalent Circuit Parameters
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for
MOS Transistor using STA
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12.
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CMOS Inverter Measurements using STA
and SPICE
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