Main Office

926-27 KT bldg, 3rd fl. Ipsuk

-dong Daegu, 701-050, Korea

Tel : +82-53-984-7063

Fax : +82-53-984-7065

 

Branch Office in Gyeonggi

605 Donggin Apt. 1511-10,

Gwanyang-dong Anyang-si,

Gyeonggi-do, Korea

Tel : +82-31-424-7063

Fax : +82-31-422-7065

Home Page

http://www.elecscom.com

Contact Point

Jongsik Park

Tel : +82-10-3813-4375

e-mail : jspark@elecscom.com

Taiyi Kim

Tel : +82-10-2877-4796

 

e-mail : tykim@elecscom.com

 

  Measurement Examples

DUT

Measurement
Name

 

Floating

Floating

Measured currents when a SMU channel is opened. (EL424)

Resistor

I-V (100K)

I-V characteristics of a 100K ohm resistor.

I-V (100G)

I-V characteristics of a 100G ohm resistor.

MOSFET

ID-VD

ID-VD measurement results for common source bias

condition.

ID, gm-VD

ID, transconductance - VD relations for common source

bias conditions.

Subthreshold Current

LOG(ID) - VG relations that include the subthreshold

current region.

Body Effect

ID, transconductance - VG relations when the body

voltage is changed.

Bipolar Transistor

IC-VC

IC-VC relations for common emitter bias conditions

Gummel

Gummel measurement results.

Hfe-IC

Hfe(Current gain) - IC relations.

JFET

ID-VD

ID-VD measurement results for common source bias

conditions.

sqrt(ID)-VG

sqrt(ID)-VG relations to extract VT voltage.

OPAMP

Inverting

Transfer characteristics of Inverting mode operational

amplifier.

Zener Diode

I-V

I-V characteristics of a 5V Zener diode.

CMOS Inverter

Transfer

Transfer characteristics of a CMOS inverter.

Transfer with variable current load

Transfer characteristics of a CMOS inverter when the load

current is changed.