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Main Office |
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926-27 KT bldg, 3rd fl. Ipsuk
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-dong Daegu, 701-050, Korea
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Tel : +82-53-984-7063
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Fax : +82-53-984-7065
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Branch Office in Gyeonggi |
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605 Donggin Apt. 1511-10,
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Gwanyang-dong Anyang-si,
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Gyeonggi-do, Korea
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Tel : +82-31-424-7063
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Fax : +82-31-422-7065
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Home Page
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http://www.elecscom.com
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Contact Point
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Jongsik Park
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Tel : +82-10-3813-4375
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e-mail : jspark@elecscom.com
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Taiyi Kim
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Tel : +82-10-2877-4796
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e-mail : tykim@elecscom.com
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Hall IC Tester (EL 660) |
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Hall IC Tester (EL660) is a mass production tester
for low power Hall ICs.
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Control
the applied magnetic field to
DUT
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by driving
SMU(Source Measurement
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Unit)
in the current mode.
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Tester
is composed of three modules;
DC,
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N-field
and S-field. The measurement
time
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is
very short by pipeline measurements
in
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the
three zones.
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Test
items such as output voltage
and
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average
power are measured dynamically
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by measuring the voltage
and currents at
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the maximum 1mega samples
per second
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Data analysis
software for DUT failure
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analysis is
available.
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Magnetic field
calibration can be
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performed
using Gauss meter by GPIB
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interface.
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