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Main Office |
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926-27 KT bldg, 3rd fl. Ipsuk
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-dong Daegu, 701-050, Korea
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Tel : +82-53-984-7063
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Fax : +82-53-984-7065
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Branch Office in Gyeonggi |
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605 Donggin Apt. 1511-10,
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Gwanyang-dong Anyang-si,
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Gyeonggi-do, Korea
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Tel : +82-31-424-7063
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Fax : +82-31-422-7065
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Home Page
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http://www.elecscom.com
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Contact Point
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Jongsik Park
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Tel : +82-10-3813-4375
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e-mail : jspark@elecscom.com
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Taiyi Kim
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Tel : +82-10-2877-4796
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e-mail : tykim@elecscom.com
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MIPI Tester (EL 780)
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Generates MIPI TX signals (One clock and four data lanes)
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Maximum Data Rate (HS mode) : 800 Mbps
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Programmable output levels for noise margin analysis
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Programmable timing parameters for AC analysis
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Timing skew adjustment (10ps res), programmable rising
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Mobile Display Tester (EL770)
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Test display modules, STN, TFT, EL, with RGB and CPU
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interface.
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MDDI interface option with maximum 400 Mbps data rate.
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46 channels programmable digital I/O
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Five DC channels: HVSU, MVSU, SMU1, SMU2, SMU3
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(Current measurable for VSU channels, voltage or current
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mode for SMU)
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Test program is based on C/C++ language.
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Mobile Display Tester (EL770)
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Semiconductor Parametric Tester (EL1400)
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E1400 test system is designed to perform fast and precise DC
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measurements, capacitance
measurements, flash memory
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cell test, and other semiconductor applications.
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E1400 test system supports real four parallel tests. The
system
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is consist of four sub-frames. Each sub-frame supports real
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parallel test.
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The system supports up to 32 SMUs. (Each sub-frame : up to
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The system supports a fully guarded switching matrix
customi- zable from 48 to 106 pins. (Each sub-frame : from 12 to 26 pins)
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System Overview
Specification
Software |
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